Texas Instruments HALL-HINGE-EVM Evaluation Module
Texas Instruments HALL-HINGE-EVM Evaluation Module offers 3D-printed structures and a magnet to evaluate the TMAG5231B1 in a hinge-lid closure apparatus. The hinge-lid closure function is commonly used in laptop lid closures and other lid and door detection applications.
The TI HALL-HINGE-EVM Evaluation Module is compatible with the HALL-ADAPTER-EVM to enable broader TI magnetic sensing portfolio testing.
Features
- Demonstrates TMAG5231 in a hinged-lid closure application
- Compatible with HALL-ADAPTER-EVM for evaluation of Hall-effect portfolio products
- 3D-print source files are available for customization
Kit Contents
- Optional AAA battery holder
- 1/8-inch cube NdFeB magnet (N42)
- 3D-printed hinge assembly
Additional Resources
Associated Products
Texas Instruments TMAG5231 Low-Power Hall Effect Switch
Designed to optimize system cost for compact, battery-operated consumer & industrial applications.
Associated Evaluation Module
Texas Instruments HALL-ADAPTER-EVM Hall Sensor Evaluation Module
Speeds up your switch, latch and linear hall sensor prototyping and testing.
PCB Layout
What's Included
Publicado: 2022-05-24
| Actualizado: 2023-10-27